The Evaluation of Debris and Smear Layer Generated by Three Rotary Instruments Neo NiTi, 2Shape and Revo_S: An Ex-vivo Scanning Electron Microscopic Study
Iranian Endodontic Journal,
Vol. 18 No. 2 (2023),
16 April 2023
,
Page 96-103
https://doi.org/10.22037/iej.v18i2.39966
Abstract
Introduction: This study compared the cleaning effectiveness of NeoNiTi, 2Shape and Revo_S rotary instruments. Materials and Methods: Fifty mandibular molar mesial roots were selected with an angle of curvature less than 20 degrees divided into three groups (n=15). Five samples were selected as negative control group. In all three systems, the final file was 25, 6%. The score of debris and smear layer in three thirds (coronal, middle and apical) of the root canal walls were evaluated using scanning electron microscopic (SEM) magnification. The data were analyzed using the Kruskal Wallis and Mann Whitney U tests for intergroup comparison (P≤0.05) and Freidman and Wilcoxon signed-rank test was employed for intragroup comparison (P≤0.05). Results: Residual debris of the 2Shape system in the apical region was significantly higher than the other two systems (P=0.039). Revo_S and 2Shape groups had significantly higher quantities of debris in the apical than the coronal region (P=0.029 and P=0.02, respectively). In the 2Shape group, the amount of mid-region debris was significantly higher (P=0.005) than the coronal. In inter-group comparison there was no significant difference in residual smear layer between the systems. In intra-group comparison in all three systems, the amount of smear layer in the coronal third was significantly higher than in the other two areas. (P=0.017, P<0.001 and P=0.032, respectively). Conclusion: 2Shape left the highest amount of debris in the apical region. The amount of debris in Revo_S and 2Shape groups in the apical region was significantly higher than in the coronal. The amount of smear layer in all three groups in the coronal area was higher than the middle and apical areas.
- Root Canal Preparation; Scanning Electron Microscopy; Smear Layer
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